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URL:https://murmitoyen.com/events/vanille/udem/detail/849083-local-strain-m
 easurements-in-photonic-devices-and-degradation-of-battery-materials-ga-bo
 tton-mcmaster
LOCATION:Université de Montréal - Pavillon J.-Armand-Bombardier\, 5155\, 
 chemin de la rampe \, Montréal\, QC\, Canada\, H3T 2B2
SUMMARY:Local Strain Measurements in Photonic Devices and Degradation of Ba
 ttery Materials - G.A. Botton (McMaster)
DESCRIPTION:Local Strain Measurements in Photonic Devices and Degradation o
 f Battery Materials investigations with Transmission Electron MicroscopyG.
 A. BottonDepartment of Materials Science and Engineering and Canadian Cent
 re for Electron MicroscopyMcMaster University
\nAbstract: Transmission Ele
 ctron Microscopy is a powerful technique that provides much more than “p
 retty pictures”. With advanced microscopy techniques\, it is possible to
  retrieve the localized strain distribution in electronic/photonic devices
 \, map the local composition at atomic resolution and extract spectroscopi
 c information on valence state in metals used in energy storage devices.
\
 nIn this presentation\, I will describe recent developments in transmissio
 n electron microscopy (TEM)\, and electron energy loss spectroscopy (EELS)
  in particular\, with examples related to the development high-bandgap mat
 erials for photonic application\, multiferroic thin films and energy stora
 ge materials. I will highlight how a new method for strain mapping can pro
 vide both high sensitivity and very large field of view\, while EELS provi
 des exquisite information on the local electronic structure\, and mechanis
 ms of degradation of Li ion batteries. Other examples will highlight how T
 EM and EELS provided valuable information both at the fundamental level an
 d in practical applications.
\nFinally\, I will discuss the prospects for 
 localized phonon spectroscopy measurements\, down to the sub-nm scale\, wi
 th new instrumentation coming to McMaster University. 
\nAbout the Canadia
 n Centre for Electron Microscopy: 
\nThe Canadian Centre for Electron Micr
 oscopy\, located at McMaster University\, is one of the CFI-Major Science 
 Initiative National Facilities. The CCEM provides world-class electron mic
 roscopy capabilities and expertise to Canadian researchers and industry wo
 rking in a broad range of fields. A brief introduction about the CCEM\, it
 s user base and infrastructure will be given. https://ccem.mcmaster.ca
\n

 \nBio: Gianluigi Botton received a degree in Engineering Physics and a PhD
  in Materials Engineering from Ecole Polytechnique de Montréal. He was Po
 stdoctoral Fellow in the Department of Materials Science and Metallurgy at
  the University of Cambridge. He joined the Materials Technology Laborator
 y of Natural Resources Canada (NRCan) in 1998 as a research scientist. In 
 2001 he moved to the Department of Materials Science and Engineering at Mc
 Master University where he holds a Tier 1 Canada Research Chair in Electro
 n Microscopy of Nanoscale Materials. He received the Metal Physics Medal o
 f the Canadian Materials Science Conference (2017)\, the Lee Hsun Research
  Award from the Institute Metals Research of the Chinese Academy of Scienc
 es (2017) and he is Fellow of the Microscopy Society of America and Fellow
  of the Royal Society of Canada. Prof. Botton established\, and currently 
 leads\, the Canadian Centre for Electron Microscopy a national facility fo
 r ultrahigh-resolution microscopy.  
\nWebsite: https://www.bottonsgroup.c
 om
\n
\n 
\nCette conférence est présentée par le RQMP Versant Nord 
 du Département de physique de l'Université de Montréal et de Génie 
 physique de la Polytechnique.
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