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PRODID:https://murmitoyen.com/events/vanille/udem/
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DTSTAMP:20260415T183456
DTSTART:20140314T113000
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URL:https://murmitoyen.com/events/vanille/udem/detail/372424
LOCATION:Université de Montréal - Pavillon Roger-Gaudry\, 2900\, chemin d
 e la Tour\, Montréal\, QC\, Canada\, H3T 1J6
SUMMARY:Atomic Force Microscopy – much more than pretty images - Peter Gr
 utter\, Université McGill
DESCRIPTION:Atomic Force Microscopy – much more than pretty imagesAtomic 
 Force Microscopy (AFM) is a technique that allows atomic scale spatial res
 olution on essentially any material\, including insulators and metals\, in
  essentially any environment: from ultra high vacuum to liquids\, at tempe
 ratures of several 100K down to mK.  These images allow extraction of det
 ailed structural information\, in particular when combined with state of t
 he art modeling. Many properties\, such as electrical surface potential\, 
 elasticity\, yield stress\, adhesion or friction can be measured and corre
 lated to structure\, often as a function of external parameters such as li
 ght or electrochemical potential. Completing this ‘nanolab’ is the cap
 ability of AFM to manipulate objects. In this colloquium I will concentrat
 e on structure-property AFM experiments that can give us fundamental insig
 hts in fields which have major potential for important applications. Some 
 of the fundamental questions one might addressare: how is charge separated
  in organic photovoltaics? What determines Li mobility in batteries? How d
 oes the electrical conductivity of a nanometer scale contact depend on mec
 hanical properties? What induces the formation of a synapse in a neuron? B
 y drawing on several examples from my research group to illustrate these c
 apabilities I will demonstrate how state-of-the-art AFM goes well beyond b
 eing a tool to make ‘pretty’ images.Cette conférence s'adresse à tou
 s\, y compris les professeurs\, les chercheurs et les étudiants des trois
  cycles.Le café est servi à partir de 11h20.
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